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Using two self-developed InDel panels to explore forensic traits and ancestral components in the Hui group |
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Titel: |
Using two self-developed InDel panels to explore forensic traits and ancestral components in the Hui group |
Auteur: |
Yuan, Xi Wang, Xi Lan, Qiong Li, Shuanglin Lin, Yifeng Zhao, Ming Xu, Hui Lei, Fanzhang Shen, Chunmei Zhu, Bofeng |
Verschenen in: |
Genomics |
Paginering: |
Jaargang 116 () nr. 1 pagina's p. |
Jaar: |
2024 |
Inhoud: |
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Uitgever: |
The Authors |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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