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                                       Details for article 16 of 16 found articles
 
 
  X-ray film reject analysis as a quality indicator
 
 
Title: X-ray film reject analysis as a quality indicator
Author: Hoeffel, Jean-Claude
Hoeffel, Christine
Appeared in: Radiography
Paging: Volume 5 (1999) nr. 2 pages 1 p.
Year: 1999
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 16 found articles
 
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