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                                       Details for article 13 of 13 found articles
 
 
  Thickness dependence of spin Seebeck resistivity in polycrystalline YIG films grown by metal organic decomposition method
 
 
Title: Thickness dependence of spin Seebeck resistivity in polycrystalline YIG films grown by metal organic decomposition method
Author: Cao Van, Phuoc
Nguyen, Thi Trinh
Duong, Viet Duc
Nguyen, Minh Hieu
Seol, Ji-Hwan
Park, Gun-Woo
Kim, Geon-Hoe
Kim, Dong-Hyun
Jeong, Jong-Ryul
Appeared in: Current applied physics
Paging: Volume 42 () nr. C pages 80-85
Year: 2022
Contents:
Publisher: Korean Physical Society
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 13 of 13 found articles
 
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