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Characterization of tunnel oxide passivated contact with n-type poly-Si on p-type c-Si wafer substrate |
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Titel: |
Characterization of tunnel oxide passivated contact with n-type poly-Si on p-type c-Si wafer substrate |
Auteur: |
Guo, Xueqi Zeng, Yuheng Zhang, Zhi Huang, Yuqing Liao, Mingdun Yang, Qing Wang, Zhixue Du, Minyong Guan, Denggao Yan, Baojie Ye, Jichun |
Verschenen in: |
Current applied physics |
Paginering: |
Jaargang 19 (2019) nr. 7 pagina's 811-816 |
Jaar: |
2019 |
Inhoud: |
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Uitgever: |
Korean Physical Society |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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