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                                       Details for article 16 of 19 found articles
 
 
  Structure properties and electrical mechanisms of Si(001)/SiO2 interface with varying Si layer thickness in nano-scale transistor
 
 
Title: Structure properties and electrical mechanisms of Si(001)/SiO2 interface with varying Si layer thickness in nano-scale transistor
Author: Li, Haixia
Ji, Aiming
Zhu, Canyan
Mao, Ling-Feng
Appeared in: Current applied physics
Paging: Volume 18 (2018) nr. 9 pages 1020-1025
Year: 2018
Contents:
Publisher: Korean Physical Society
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 19 found articles
 
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