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Details for article 7 of 15 found articles
| Title: |
Elimination of endurance degradation by oxygen annealing in bilayer ZnO/CeO2-x thin films for nonvolatile resistive memory |
| Author: |
Ismail, Muhammad Jabeen, Shazia Akber, Tahira Talib, Ijaz Hussain, Fayyaz Rana, Anwar Manzoor Hussain, Muhammad Mahmood, Khalid Ahmed, Ejaz Bao, Dinghua |
| Appeared in: |
Current applied physics |
| Paging: | Volume 18 (2018) nr. 8 pages 924-932 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Korean Physical Society |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 15 found articles
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