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Journal description
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Details for article 31 of 31 found articles
| Title: |
X-ray photoelectron spectroscopic studies of CeO2 thin films deposited on Ni-W (100), c-Al2O3 (0001) and Si (100) substrates |
| Author: |
Singh, Preetam Srivatsa, K.M.K. Barvat, Arun Pal, Prabir |
| Appeared in: |
Current applied physics |
| Paging: | Volume 16 (2016) nr. 10 pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 31 of 31 found articles
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