|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 9 of 30 found articles
| Title: |
Electrical characterization studies of p-type Ge, Ge1−y
Sn
y
, and Si0.09Ge0.882Sn0.028 grown on n-Si substrates |
| Author: |
Harris, Thomas R. Ryu, Mee-Yi Yeo, Yung Kee Beeler, Richard T. Kouvetakis, John |
| Appeared in: |
Current applied physics |
| Paging: | Volume 14 (2014) nr. S1 pages 6 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 30 found articles
| << previous | next >> |