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Details for article 20 of 25 found articles
| Title: |
Relationship between interface property and energy band alignment of thermally grown SiO2 on 4H-SiC(0001) |
| Author: |
Hosoi, Takuji Kirino, Takashi Mitani, Shuhei Nakano, Yuki Nakamura, Takashi Shimura, Takayoshi Watanabe, Heiji |
| Appeared in: |
Current applied physics |
| Paging: | Volume 12 (2012) nr. S3 pages 4 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 25 found articles
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