|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 34 of 40 found articles
| Title: |
Spectroscopic ellipsometry modeling of ZnO thin films with various O2 partial pressures |
| Author: |
Cho, Edward Namkyu Park, Suehye Yun, Ilgu |
| Appeared in: |
Current applied physics |
| Paging: | Volume 12 (2012) nr. 6 pages 5 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 40 found articles
| << previous | next >> |