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                                       Details for article 16 of 101 found articles
 
 
  Depth profiling organic light-emitting devices by gas-cluster ion beam sputtering and X-ray photoelectron spectroscopy
 
 
Title: Depth profiling organic light-emitting devices by gas-cluster ion beam sputtering and X-ray photoelectron spectroscopy
Author: Erickson, Nicholas C.
Raman, Sankar N.
Hammond, John S.
Holmes, Russell J.
Appeared in: Organic electronics
Paging: Volume 15 (2014) nr. 11 pages 5 p.
Year: 2014
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 101 found articles
 
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