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Journal description
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Details for article 41 of 60 found articles
| Title: |
Representative volume element analysis for wafer-level warpage using Finite Element methods |
| Author: |
Baek, Jong Won Yang, Woo Seok Hur, Min Jae Yun, Jin Chul Park, Seong Jin |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 91 (2019) nr. C pages 392-398 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 41 of 60 found articles
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