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Details for article 11 of 51 found articles
| Title: |
Electrical and structural characterization of PLD grown CeO2–HfO2 laminated high-k gate dielectrics |
| Author: |
Karakaya, K. Barcones, B. Rittersma, Z.M. van Berkum, J.G.M. Verheijen, M.A. Rijnders, G. Blank, D.H.A. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 9 (2006) nr. 6 pages 4 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 51 found articles
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