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Journal description
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Details for article 58 of 81 found articles
| Title: |
Optical and crystallographic analysis of thin films of GeC deposited using a unique hollow cathode sputtering technique |
| Author: |
Huguenin-Love, J.L. Soukup, R.J. Ianno, N.J. Schrader, J.S. Thompson, D.W. Dalal, V.L. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 9 (2006) nr. 4-5 pages 5 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 58 of 81 found articles
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