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Journal description
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Details for article 22 of 34 found articles
| Title: |
Influence of Mg ion concentration in ZrO2 gate dielectric layered silicon based MOS capacitors for memory applications: Thorough understanding of conduction processes |
| Author: |
Bhanu, J. Udaya Babu, G. Ramesh Thangadurai, P. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 89 (2019) nr. C pages 85-96 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 34 found articles
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