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                                       Details for article 15 of 83 found articles
 
 
  Characterisation of virtual substrates with ultra-thin Si0.6Ge0.4 strain relaxed buffers
 
 
Title: Characterisation of virtual substrates with ultra-thin Si0.6Ge0.4 strain relaxed buffers
Author: Lyutovich, Klara
Werner, Jens
Oehme, Michael
Kasper, Erich
Perova, Tatiana
Appeared in: Materials science in semiconductor processing
Paging: Volume 8 (2005) nr. 1-3 pages 5 p.
Year: 2005
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 83 found articles
 
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