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Journal description
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Details for article 9 of 19 found articles
| Title: |
From thin film to bulk 3C-SiC growth: Understanding the mechanism of defects reduction |
| Author: |
La Via, F. Severino, A. Anzalone, R. Bongiorno, C. Litrico, G. Mauceri, M. Schoeler, M. Schuh, P. Wellmann, P. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 78 () nr. C pages 57-68 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 19 found articles
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