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                                       Details for article 6 of 17 found articles
 
 
  Improvement of gate CD imbalance for a 0.35μm logic technology
 
 
Title: Improvement of gate CD imbalance for a 0.35μm logic technology
Author: Joung, Yang Hee
Mun, Seong Yeol
Kang, Seong Jun
Appeared in: Materials science in semiconductor processing
Paging: Volume 7 (2004) nr. 1-2 pages 4 p.
Year: 2004
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 17 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands