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                                       Details for article 3 of 39 found articles
 
 
  Comparative studies of normally-off Al0.26Ga0.74N/AlN/GaN/Si high electron mobility transistors with different gate structures
 
 
Title: Comparative studies of normally-off Al0.26Ga0.74N/AlN/GaN/Si high electron mobility transistors with different gate structures
Author: Lee, Ching-Sung
Hsu, Wei-Chou
Liu, Han-Yin
Chen, Si-Fu
Chen, Yu-Chang
Yang, Shen-Tin
Appeared in: Materials science in semiconductor processing
Paging: Volume 66 (2017) nr. C pages 5 p.
Year: 2017
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 39 found articles
 
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