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Journal description
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Details for article 27 of 78 found articles
| Title: |
Femtosecond nonlinear optical characterisation of silicon wafers: the role of symmetry |
| Author: |
Reif, J. Schneider, Th. Wolfframm, D. Schmid, R.P. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 4 (2001) nr. 1-3 pages 241-243 |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 27 of 78 found articles
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