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Details for article 36 of 42 found articles
| Title: |
Systematic analysis of the trapping and reliability of Al2O3/GaN MOS capacitors with different atomic layer deposition techniques |
| Author: |
Fregolent, Manuel Tomasi, Marco De Santi, Carlo Buffolo, Matteo Tadmor, Liad Brusaterra, Enrico Treidel, Eldad Bahat Cester, Andrea Meneghesso, Gaudenzio Zanoni, Enrico Meneghini, Matteo |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 195 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 42 found articles
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