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Journal description
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Details for article 1 of 34 found articles
| Title: |
A lightweight model and agent framework for fast and accurate surface defect detection in MoS 2 films |
| Author: |
Zhou, Ruiliang Yang, Jian Liu, Hailong Xu, Chen Pu, Yan Babichuk, Ivan S. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 193 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 34 found articles
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