Effect of N2 concentration on structural, morphological, and optoelectronic properties of Cu3N films fabricated by RF magnetron sputtering for photodetection applications
Titel:
Effect of N2 concentration on structural, morphological, and optoelectronic properties of Cu3N films fabricated by RF magnetron sputtering for photodetection applications
Auteur:
Rodríguez-Tapiador, M.I. Mánuel, José M. Blanco, E. Márquez, E. Gordillo, N. Sainz, R. Merino, J. Fernández, S.