Effect of extended defects on phonon confinement in polycrystalline Si and Ge films
Titel:
Effect of extended defects on phonon confinement in polycrystalline Si and Ge films
Auteur:
Arapkina, Larisa V. Chizh, Kirill V. Uvarov, Oleg V. Voronov, Valery V. Dubkov, Vladimir P. Storozhevykh, Mikhail S. Poliakov, Maksim V. Volkova, Lidiya S. Edelbekova, Polina A. Klimenko, Alexey A. Dudin, Alexander A. Yuryev, Vladimir A.