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                                       Details for article 39 of 43 found articles
 
 
  Theoretical studies on phase stability, electronic, optical, mechanical and thermal properties of chalcopyrite semiconductors HgXN2 (X=Si, Ge and Sn): A comprehensive DFT analysis
 
 
Title: Theoretical studies on phase stability, electronic, optical, mechanical and thermal properties of chalcopyrite semiconductors HgXN2 (X=Si, Ge and Sn): A comprehensive DFT analysis
Author: Hossain, A.
Ali, M.A.
Uddin, M.M.
Naqib, S.H.
Hossain, M.M.
Appeared in: Materials science in semiconductor processing
Paging: Volume 172 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 39 of 43 found articles
 
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