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                                       Details for article 25 of 43 found articles
 
 
  Indium-zinc-tin-oxide thin-film-transistor reliability enhancement using fluoridation with CF4 reactive sputtering
 
 
Title: Indium-zinc-tin-oxide thin-film-transistor reliability enhancement using fluoridation with CF4 reactive sputtering
Author: Fan, Ching-Lin
Hsin, Tzu-Chun
Yu, Xiang-Wei
Lin, Zhe-Chen
Appeared in: Materials science in semiconductor processing
Paging: Volume 172 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 43 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands