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Journal description
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Details for article 19 of 48 found articles
| Title: |
Extracting defect profiles in ion-implanted GaN from ion channeling |
| Author: |
Caçador, A. Jóźwik, P. Magalhães, S. Marques, J.G. Wendler, E. Lorenz, K. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 166 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 48 found articles
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