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Journal description
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Details for article 29 of 114 found articles
| Title: |
Electrical characterization of MFeOS gate stacks for ferroelectric FETs |
| Author: |
Kumar, Atul Rao, Ashwath Goswami, Manish Singh, B.R. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 16 (2013) nr. 6 pages 5 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 114 found articles
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