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Journal description
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Details for article 3 of 17 found articles
| Title: |
Defects annealing in 4H–SiC epitaxial layer probed by low temperature photoluminescence |
| Author: |
Litrico, G. Zimbone, M. Musumeci, P. Calcagno, L. |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 15 (2012) nr. 6 pages 4 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 17 found articles
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