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Journal description
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Details for article 9 of 61 found articles
| Title: |
Chemical defect-dependent resistive switching characterization in CeO2 thin films |
| Author: |
Be Lan, Tran Thi Li, Yu-Teng Aidan Sun, An-Cheng Lu, Hsi-Chuan Wang, Sea-Fue |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 137 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 61 found articles
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