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Journal description
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Details for article 27 of 60 found articles
| Title: |
Multilayer SiNx passivated Al2O3 gate dielectric featuring a robust interface for ultralong-lifetime AlGaN/GaN HEMT |
| Author: |
Wang, Cong Wei, Yu-Chen Tan, Xiao Ali, Luqman Jing, Chang-Qiang |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 135 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 27 of 60 found articles
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