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Journal description
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Details for article 10 of 137 found articles
| Title: |
Characterizing and modeling current gain degradation in bipolar transistor exposed to heavy ion radiation |
| Author: |
Liu, Ziyu Sun, Yabin Wang, Teng Li, Xiaojin Shi, Yanling |
| Appeared in: |
Materials science in semiconductor processing |
| Paging: | Volume 121 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 137 found articles
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