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Journal description
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Details for article 47 of 54 found articles
| Title: |
Study of the interface Si-nc/SiO2 by infrared spectroscopic ellipsometry and X-ray photoelectron spectroscopy |
| Author: |
Stenger, I. Gallas, B. Siozade, L. Fisson, S. Vuye, G. Chenot, S. Rivory, J. |
| Appeared in: |
Physica. E, Low-dimensional systems and nanostructures |
| Paging: | Volume 38 (2007) nr. 1-2 pages 5 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 47 of 54 found articles
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