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Influence of the thickness of the tunnel layer on the charging characteristics of Si nanocrystals embedded in an ultra-thin SiO2 layer |
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Title: |
Influence of the thickness of the tunnel layer on the charging characteristics of Si nanocrystals embedded in an ultra-thin SiO2 layer |
Author: |
Dumas, C. Grisolia, J. BenAssayag, G. Bonafos, C. Schamm, S. Claverie, A. Arbouet, A. Carrada, M. Paillard, V. Shalchian, M. |
Appeared in: |
Physica. E, Low-dimensional systems and nanostructures |
Paging: |
Volume 38 (2007) nr. 1-2 pages 5 p. |
Year: |
2007 |
Contents: |
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Publisher: |
Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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