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                                       Details for article 12 of 51 found articles
 
 
  Electron holographic characterization of nanoscale charge distributions for ultra shallow PN junctions in Si
 
 
Title: Electron holographic characterization of nanoscale charge distributions for ultra shallow PN junctions in Si
Author: Chakraborty, P.S.
McCartney, M.R.
Li, J.
Gopalan, C.
Singisetti, U.
Goodnick, S.M.
Thornton, T.J.
Kozicki, M.N.
Appeared in: Physica. E, Low-dimensional systems and nanostructures
Paging: Volume 19 (2003) nr. 1-2 pages 6 p.
Year: 2003
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 51 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands