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Journal description
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Details for article 2 of 14 found articles
| Title: |
An order(N) tight-binding molecular dynamics study of intrinsic defect diffusion in silicon |
| Author: |
Roberts, Bruce W. Luo, Weiwei Johnson, Kurt A. Clancy, Paulette |
| Appeared in: |
Chemical engineering journal |
| Paging: | Volume 74 (1999) nr. 1-2 pages 9 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science S.A. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 14 found articles
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