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                                       Details for article 5384 of 6123 found articles
 
 
  Temperature dependence of the yield strength of aluminum thin films: Multiscale modeling approach
 
 
Title: Temperature dependence of the yield strength of aluminum thin films: Multiscale modeling approach
Author: Davoudi, Kamyar
Appeared in: Scripta materialia
Paging: Volume 131 (2017) nr. C pages 63-66
Year: 2017
Contents:
Publisher: Acta Materialia Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5384 of 6123 found articles
 
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