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                                       Details for article 873 of 6123 found articles
 
 
  Comparing Raman mapping and electron microscopy for characterizing compositional gradients in thermoelectric materials
 
 
Title: Comparing Raman mapping and electron microscopy for characterizing compositional gradients in thermoelectric materials
Author: Yasseri, Mohammad
Schüpfer, Dominique
Weinhold, Marcel
Chen, Limei
Kamila, Hasbuna
Müller, Eckhard
de Boor, Johannes
Klar, Peter J.
Appeared in: Scripta materialia
Paging: Volume 179 () nr. C pages 61-64
Year: 2020
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 873 of 6123 found articles
 
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