|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 21 found articles
| Title: |
Application of edge-to-edge matching model to understand the in-plane texture of TiSi2 (C49) thin films on (001)Si surface |
| Author: |
Zhang, M.-X. Kelly, P.M. |
| Appeared in: |
Scripta materialia |
| Paging: | Volume 55 (2006) nr. 7 pages 4 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Acta Materialia Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 21 found articles
| << previous | next >> |