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                                       Details for article 16 of 41 found articles
 
 
  Fracture toughness of intermetallic Cu6Sn5 in lead-free solder microelectronics
 
 
Title: Fracture toughness of intermetallic Cu6Sn5 in lead-free solder microelectronics
Author: Philippi, Bastian
Matoy, Kurt
Zechner, Johannes
Kirchlechner, Christoph
Dehm, Gerhard
Appeared in: Scripta materialia
Paging: Volume 123 (2016) nr. C pages 38-41
Year: 2016
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 41 found articles
 
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