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                                       Details for article 21 of 34 found articles
 
 
  Investigation of diffusion and electromigration parameters for Cu–Sn intermetallic compounds in Pb-free solders using simulated annealing
 
 
Title: Investigation of diffusion and electromigration parameters for Cu–Sn intermetallic compounds in Pb-free solders using simulated annealing
Author: Chao, Brook
Chae, Seung-Hyun
Zhang, Xuefeng
Lu, Kuan-Hsun
Im, Jay
Ho, P.S.
Appeared in: Acta Materialia
Paging: Volume 55 (2007) nr. 8 pages 10 p.
Year: 2007
Contents:
Publisher: Acta Materialia Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 21 of 34 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands