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                                       Details for article 7 of 26 found articles
 
 
  Direction-dependent grain interaction in nickel and copper thin films, analysed by X-ray diffraction
 
 
Title: Direction-dependent grain interaction in nickel and copper thin films, analysed by X-ray diffraction
Author: Kumar, A.
Welzel, U.
Mittemeijer, E.J.
Appeared in: Acta Materialia
Paging: Volume 54 (2006) nr. 5 pages 12 p.
Year: 2006
Contents:
Publisher: Acta Materialia Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 26 found articles
 
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