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Details for article 3 of 43 found articles
| Title: |
A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on sapphire |
| Author: |
Dehm, G. Rühle, M. Conway, H.D. Raj, R. |
| Appeared in: |
Acta Materialia |
| Paging: | Volume 45 (1997) nr. 2 pages 11 p. |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Acta Metallurgica Inc. All rights reserved |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 43 found articles
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