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                                       Details for article 29 of 66 found articles
 
 
  Enhanced reliability of Cu-Sn bonding through the microstructure evolution of nanotwinned copper
 
 
Title: Enhanced reliability of Cu-Sn bonding through the microstructure evolution of nanotwinned copper
Author: Jin, Xinyu
Li, Huahan
Sun, Yingying
Chen, Zhiqin
Chen, Peixin
Su, Hongwei
Li, Ming
Wu, Yunwen
Appeared in: Acta Materialia
Paging: Volume 283 () nr. C pages p.
Year: 2025
Contents:
Publisher: Acta Materialia Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 29 of 66 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands