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                                       Details for article 21 of 44 found articles
 
 
  Insights into abnormal grain growth in copper thin films for reduced electrical resistivity: A quantitative multi-order-parameter phase-field study under finite element framework
 
 
Title: Insights into abnormal grain growth in copper thin films for reduced electrical resistivity: A quantitative multi-order-parameter phase-field study under finite element framework
Author: Peng, Wei
Gao, Jianbao
Lu, Tiwen
Sun, Binhan
Zhang, Xiancheng
Zhang, Lijun
Tu, Shantung
Appeared in: Acta Materialia
Paging: Volume 260 () nr. C pages p.
Year: 2023
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 21 of 44 found articles
 
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