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  Atomic-Scale Investigation of Electromigration with Different Directions of Electron Flow into High-Density Nanotwinned Copper through In Situ HRTEM
 
 
Title: Atomic-Scale Investigation of Electromigration with Different Directions of Electron Flow into High-Density Nanotwinned Copper through In Situ HRTEM
Author: Shen, Fang-Chun
Huang, Chih-Yang
Lo, Hung-Yang
Hsu, Wei-You
Wang, Chien-Hua
Chen, Chih
Wu, Wen-Wei
Appeared in: Acta Materialia
Paging: Volume 219 () nr. C pages p.
Year: 2021
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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