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                                       Details for article 39 of 91 found articles
 
 
  High resolution determination of local residual stress gradients in single- and multilayer thin film systems
 
 
Title: High resolution determination of local residual stress gradients in single- and multilayer thin film systems
Author: Treml, R.
Kozic, D.
Zechner, J.
Maeder, X.
Sartory, B.
Gänser, H.-P.
Schöngrundner, R.
Michler, J.
Brunner, R.
Kiener, D.
Appeared in: Acta Materialia
Paging: Volume 103 () nr. C pages 616-623
Year: 2016
Contents:
Publisher: The Author(s)
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 39 of 91 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands