Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 2 of 104 found articles
 
 
  A Copula network deconvolution-based direct correlation disentangling framework for explainable fault detection in semiconductor wafer fabrication
 
 
Title: A Copula network deconvolution-based direct correlation disentangling framework for explainable fault detection in semiconductor wafer fabrication
Author: Xu, Hong-Wei
Qin, Wei
Hu, Jin-Hua
Sun, Yan-Ning
Lv, You-Long
Zhang, Jie
Appeared in: Advanced engineering informatics
Paging: Volume 59 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 104 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands