|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 39 of 43 found articles
| Title: |
SMD LED chips defect detection using a YOLOv3-dense model |
| Author: |
Chen, Ssu-Han Tsai, Chia-Chun |
| Appeared in: |
Advanced engineering informatics |
| Paging: | Volume 47 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 43 found articles
| << previous | next >> |