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                                       Details for article 9 of 9 found articles
 
 
  Variable slice thickness (VAST) EPI for the reduction of susceptibility artifacts in whole-brain GE-EPI at 7 Tesla
 
 
Title: Variable slice thickness (VAST) EPI for the reduction of susceptibility artifacts in whole-brain GE-EPI at 7 Tesla
Author: Brunheim, Sascha
Johst, Sören
Pfaffenrot, Viktor
Maderwald, Stefan
Quick, Harald H.
Poser, Benedikt A.
Appeared in: Magnetic resonance materials in physics, biology, and medicine
Paging: Volume 30 (2017) nr. 6 pages 591-607
Year: 2017
Contents:
Publisher: Springer Berlin Heidelberg, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 9 found articles
 
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